The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 1986

Filed:

Jun. 02, 1982
Applicant:
Inventors:

Minoru Kamiya, Tokyo, JP;

Masayuki Masuyama, Tokyo, JP;

Ikuo Kitao, Tokyo, JP;

Shinji Wada, Tokyo, JP;

Kiwami Horiguchi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351211 ;
Abstract

An eye refractometer comprising a measuring target projection optical system for projecting a measuring target image to the eye fundus of a patient's eye by means of a pair of beams of light from a measuring target; a rotating device for rotating the pair of beams of light around the optical axis; a measuring target image-forming optical system for forming a target image of the beams of light projected through the measuring target image projected to the eye fundus; a detection device for two-dimensionally detecting the position of the target image formed by the image-forming optical system on a plane perpendicular to the optical axis; and an operating circuit for obtaining a refractive power of the eye along a radial line passing through the centers of the pair of beams of light by means of the signal from the detection device.


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