The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 1986

Filed:

Jun. 30, 1983
Applicant:
Inventors:

Marc A Auslander, Millwood, NY (US);

John Cocke, Bedford, NY (US);

Hsieh T Hao, Chappaqua, NY (US);

Peter W Markstein, Yorktown Heights, NY (US);

George Radin, Piermont, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364200 ;
Abstract

A mechanism for performing a run-time storage address validity check within one machine cycle. The mechanism, functioning together with an intelligent compiler, eliminates the need for hardware implementation of a storage validity check. More particularly, the mechanism performs its function in one machine cycle in the event that a trap exception does not cause an interrupt. In the rare instance when an interrupt is necessary, a number of machine cycles will be impacted. The mechanism comprises a minimum amount of logic circuitry for determining the trap condition operating in conjunction with conventional, previously existing compare, branch instruction testing, and interrupt generation circuitry.


Find Patent Forward Citations

Loading…