The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 1986
Filed:
Aug. 02, 1984
Shigeru Nagatomo, Kanagawa, JP;
Yukio Yasuda, Kanagawa, JP;
Nobuhito Masuda, Kanagawa, JP;
Hajime Makiuchi, Kanagawa, JP;
Masaki Okazaki, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
A dry type multilayer analysis element for assaying a concentration of a specific component utilizing a competitive immunological reaction comprises a detection element comprising a detection layer which receives a labelled complex formed as a result of the competitive immunological reaction or an optically detectable change formed dependent upon an amount of the labelled complex of the specific component and having further provided thereon the detection layer a reaction layer comprising a fibrous porous medium containing fine particles therein. The multilayer analysis element absorbs an amount of a sample solution necessary for the competitive immunological reaction so that the multilayer analysis element has high sensitivity and high reproducibility.