The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 1986

Filed:

May. 07, 1984
Applicant:
Inventors:

Johannes C Muller, Eindhoven, NL;

Arnoldus R Schout, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73162 ; 3317 / ;
Abstract

For measuring single flank error, the toothed wheels are secured onto respective shafts, so that the toothed wheels intermesh. Each shaft has a disk on it having a diameter equal to the diameter of the respective toothed wheel, and a single length of wire or tape is wound around the first of the disks, over a measuring disk disposed on a displaceable carriage, and then around the other of the disks. Upon rotation of the toothed wheels, the carriage moves to maintain the wire or tape taut, and rotation of the measuring disk provides a measure of the single flank error.


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