The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 1986
Filed:
Nov. 07, 1983
James R Braig, Santa Ana, CA (US);
Max D Liston, Irvine, CA (US);
Liston Edwards, Inc., Newport Beach, CA (US);
Abstract
The percentage gas concentration within a sample as measured in a conventional optical bench is derived from the composite signal of the reference beam and sample beam transmitted through a sample cell in the optical bench. The primary source, which generates the reference beam and the secondary source which generates the sample beam are driven ninety degrees out of phase. The composite signal derived from the detector in the optical bench is digitized and then integrated according to the quadrature of the primary component of the composite signal derived from the reference beam, and is also integrated according to the quadrature of the secondary component of the composite signal derived from the sample beam. What is obtained is the integral of the absolute value of the secondary component and the integral of the absolute value of the primary component of the composite signal over one cycle of the reference beam and sample beam. The ratio of these component signals is computed to obtain a signal which is related to the percentage concentration of reference gas contained within the sample.