The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 1986
Filed:
Feb. 03, 1984
Andrew A Maudsley, Woburn, MA (US);
Sadek K Hilal, New York, NY (US);
Howard E Simon, Monroe, CT (US);
Philips Medical Systems, Inc., Shelton, CT (US);
Abstract
Measurement of magnetic field distributions is performed using a method based on the nuclear magnetic resonance (NMR) technique of Pourier imaging. By selecting objects which limit the spatial distribution of the NMR observable nuclei, images can be obtained which allow easy interpretation of the magnetic field distribution and facilitate rapid shimming of magnets. A method for providing a convenient display of field data is provided, as well as chemical shift imaging with correction for static field inhomogeneity. Results from these field plots are used as corrections for static field inhomogeniety when obtaining a chemical shift image. A method for localized spectral analysis from the chemical shift image is also provided.