The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 1986

Filed:

Jan. 25, 1984
Applicant:
Inventors:

Jean-Claude A Chastang, Mahopac, NY (US);

Walter W Hildenbrand, Brewster, NY (US);

Menachem Levanoni, Yorktown Heights, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356369 ;
Abstract

This is a static photometric polarimeter for use with a sample S upon which a beam passed through a beam splitter (which reflects the beam to a detector D.sub.o) and which beam is 45.degree. polarized. The reflection of the beam from the surface of sample S is passed to a polarizing beam splitter with one portion of the reflected beam going to a detector D.sub.s which measures the perpendicular polarization component of the beam and the other portion of the beam going to the detector D.sub.p which measures the parallel polarized portion of the reflected beam.


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