The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 1986
Filed:
Dec. 16, 1983
Wilfried Auch, Asperg, DE;
Eberhard Schlemper, Vaihingen, DE;
International Standard Electric Corporation, New York, NY (US);
Abstract
The rotation rate measuring instrument, in which the phase difference caused by the Sagnac effect is evaluated, contains two optical waveguides (7, 17). From a light beam, two component beams (CW, CCW) are derived which traverse the first optical waveguide (7) in opposite directions. A passive beam splitter (16) connects the first optical waveguide with the second optical waveguide (17) and splits each of the component beams into two further component beams. Of these further component beams, one remains in the first optical waveguide, and the other enters the second optical waveguide, where it propagates in the opposite direction. Evaluation, for which the two component beams are combined after having traversed one or both optical waveguides, takes place on a time-division multiplex basis, such that either the traversal of only one optical waveguide (7) or the traversal of both optical waveguides (7, 17) is taken into account. By comparing the two measurements, additional nonreciprocal phase differences (.phi..sub.NR) are determined, which can be taken into account during evaluation.