The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 1986

Filed:

Mar. 23, 1984
Applicant:
Inventors:

Rene Franchy, Julich, DE;

Harald Ibach, Aachen-Verlautenheide, DE;

Heinz D Bruchmann, Aldenhoven-Durbosland, DE;

Assignee:

KFA Julich, , DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
250305 ; 2505051 ;
Abstract

An electron energy analyzer in which electrons arriving through an entrance aperture in an energy-dispersive system, are simultaneously analyzed at the exit of the system through a multi-channel detector operating with channel plates. The electron energy analyzer is distinguished through a grid at the exit of the analyzer which is to be brought to the potential of the entrance aperture plate, at the smallest possible spacing from the channel plate or plates, whose mesh size dimension is so small in comparison with the dimension of the electron beam, that no additional structure will be obtained in the registered electron spectrum because of the grid, with a blending grid mask whose blending conforms with the beam dimension and the spacing of the electrodes in the analyzer, and which is brought to a potential with respect to the channel plate, which is adequate for the aspiration of the electrons strayed from the facing channel plate.


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