The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 1986
Filed:
Dec. 30, 1982
Sam Lovalenti, Toledo, OH (US);
Owens-Illinois, Inc., Toledo, OH (US);
Abstract
A method and apparatus for inspecting a translucent container to detect a radial reflective defect in the container is disclosed. The apparatus comprises means for illuminating a container by focusing a radiant beam of light into an elongated image extending in a direction parallel to the longitudinal axis of the container along a portion of the container being inspected. The apparatus also comprises means focused on the illuminated portion of the container for sensing the intensity of light reflected from the illuminated portion and for viewing the illuminated portion from a direction and forming an angle ranging from about 75 degrees to about 105 degrees from a path of the incident beam of light. The sensing means provides a plurality of the electrical signals each proportional to the reflected intensity from a corresponding position on the illuminated portion of the container. The apparatus also comprises means responsive to the plurality of electrical signals for providing a reject signal when one of the plurality of electrical signals exceeds a predetermined threshold in response to the presence of a reflective defect.