The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 1986

Filed:

Feb. 15, 1985
Applicant:
Inventors:

Yuzuru Hanaoka, Tokyo, JP;

Takeshi Murayama, Tokyo, JP;

Setsuo Muramoto, Tokyo, JP;

Tamizo Matsuura, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; B01D / ;
U.S. Cl.
CPC ...
436150 ; 73 6 / ; 210649 ; 210656 ; 422 70 ; 436161 ; 436175 ; 436178 ;
Abstract

Method and apparatus for analysis, by ion chromatography, of anions, in a sample solution, wherein accurate analysis of anions in the sample solution is obtained by passing carbonic acid, through a prescribed membrane, into the sample solution, thereby completely eliminating or sharply lessening the so-called water dip effect. The method and apparatus are further directed to enabling anions in the sample solution to be accurately analyzed by passing prescribed cations, through a prescribed membrane, into the sample solution, thereby depriving the sample solution of interfering anions otherwise abundantly present therein.


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