The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 1986

Filed:

May. 31, 1984
Applicant:
Inventor:

Shigehiro Kimura, Gyoda, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G06F / ;
U.S. Cl.
CPC ...
324 / ; 371 25 ;
Abstract

A test system for simultaneously testing a plurality of logic circuits first sets them all to an initial state before beginning testing. The faulty logic circuits which cannot be set to the initial state can be identified, and the testing of the others can proceed, even after only one cycle of attempting to initialize all the logic circuits. If all the logic circuits are faulty, the further testing can be prevented.


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