The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 1986
Filed:
Jun. 18, 1984
Chun B Lim, Solon, OH (US);
Richard L Chaney, Cuyahoga Falls, OH (US);
Roger J Kump, Mentor, OH (US);
Technicare Corporation, Solon, OH (US);
Abstract
A method for correcting predictable errors in the location of detected scintillation events acquired during emission computed tomography by a rotational scintillation gamma camera system. The method includes calibrating the rotational scintillation camera system and generating a look-up table comprising a set of pairs of x and y offset values, one pair for each viewing angle. The calibration reflects systemic deviations in the location of the rotating camera head detector measured in terms of x and y coordinates in the frame of reference of the detector for a plurality of view angles relative to the geometric ideal expected path. Once a look-up table is generated for a camera system, the detected location of each gamma event is altered in real time by adjusting in the camera head the x,y coordinate location of each event by the x,y offset values previously generated for the corresponding viewing angle associated with the detected event.