The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 1986
Filed:
Feb. 04, 1982
The Charles Stark Draper Laboratory, Cambridge, MA (US);
Abstract
A machine tool system having an adjustable implement mounted in a holder or chuck and moveably positioned relative to a moveable workpiece support, wherein implement adjustments are produced by controlled differential motion between the implement holder and an adjustment fixture on the workpiece support. The support is moved to engage the implement in the fixture, from which state further relative movement unlocks an implement clamp and produces a desired adjustment in the implement. Typical implement adjustment applications would include setting of a boring bar cutting radius (or setting of a measurement gauge dimension). The adjustments can be performed open loop based on prior calibration of implement adjustment versus extent of support motion, or closed loop wherein an initial cut (or measurement) is made by open loop implement adjustment with subsequent adjustments based upon a measurement made of the implements effective cutting (or measurement) dimension. Desired incremental changes in cut (or measurement) dimensions are then effectuated through corresponding incremental support motion. Closed loop mesurement and adjustment iterations largely overcome implement dimension errors due to rechucking, thermal drifts, machine motion position offsets, implement or contact point phenomena effects, speed-related dynamic distortions, gradual implement/wear and implement/workpiece force compliance. These measurements for iterative adjustment can be made with manual or automated gauging systems, either separate or integral to the machine adjustable implement system. The implement adjustment mechanism can be provided with a substantial mechanical advantage to correspondingly increase accuracy in implement adjustment.