The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 1986
Filed:
Feb. 08, 1985
Walter L Davis, Milton-Freewater, OR (US);
Dale Messenger, Montgomery, AL (US);
Malcolm W Randall, Milton-Freewater, OR (US);
Key Technology, Inc., Milton-Freewater, OR (US);
Abstract
An optical inspection system for articles moved by a conveyor, in which photo-electric transducers of one or more cameras are directed onto a transverse viewing area to detect light variations in individual articles. A threshold system permits correction for light signals in relation to the angular distance between the article being observed and the camera optical axis. A two-step inspection involves first detecting anomalous light levels, and subsequently detecting the size of each defect.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile