The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 1986

Filed:

Nov. 08, 1984
Applicant:
Inventors:

Kazuo Kato, Ibaraki, JP;

Takeshi Hirayama, Mito, JP;

Shigeaki Yoshida, Sayama, JP;

Yoshinori Sato, Mitaka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ;
U.S. Cl.
CPC ...
3403 / ; 3403 / ; 3403 / ;
Abstract

A method of testing a successive comparison type analog/digital converter which incorporates a voltage comparator, a register for successive comparison and a digital/analog converter. A reference digital signal is inputted to the incorporated digital/analog comparator to be converted into an analog signal, while a digital signal corresponding to the reference digital signal is inputted to an externally provided reference digital/analog converter to be converted into an analog signal. Both analog signals thus produced are compared with each other through the incorporated voltage comparator to thereby determine conversion accuracy. A successive comparison type analog/digital converter suited for the test includes further a change-over switch for introducing the externally supplied digital signal to the incorporated digital/analog converter and a changeover switch for leading outwardly the output signal from the voltage comparator.


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