The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 1986
Filed:
Feb. 02, 1983
Ryosaku Tagaya, Gunma, JP;
Eisai Co., Ltd., Tokyo, JP;
Abstract
When a plural number of subjects to be tested are continuously and sequentially measured, and the values obtained by measurement are compared with a standard value for judgement, a prescribed number of newly inputted measured values are sequentially stored, a mean value is computed basing upon stored values for determining the standard value for judgement, and the measured values are compared with the standard value for judgement for judging whether these measured values are to be employed or not. Whenever new measured values are inputted, a new standard value is determined. If there is a value for an inferior subject among newly inputted measured values, the value is omitted from computation of the standard value for judgement.