The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 1986
Filed:
Feb. 09, 1984
Yoshiro Fukasawa, Tokyo, JP;
Japan Spectroscopic Co., Ltd., Hachioji, JP;
Abstract
A double-beam spectrophotometer for spectral analysis of a sample in the infrared region is provided in which to eliminate errors in measurement of the absorbance of the sample caused by undesired thermal radiation from the sample itself, first and second sectors are used for division and recombination of beam paths and coordinated such that a detector which receives a beam along the combined beam path produces output signals consisting of components having a frequency f associated with the cycle of operation of the sectors and components having a frequency 2f, those components having frequencies f and 2f are independently derived out of the detector output signals, and the ratio of the components is computed, thereby obtaining the ratio of intensity of sample beam to reference beam independent of the undesired thermal radiation.