The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 1986
Filed:
Dec. 19, 1984
Applicant:
Inventors:
Jerzy S Krasinski, Green Brook, NJ (US);
Donald F Heller, Bound Brook, NJ (US);
Oded Kafri, Beer-sheva, IL;
Assignee:
Allied Corporation, Morris Township, NJ (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350502 ; 350508 ; 350527 ; 356376 ;
Abstract
A moire microscope comprises an objective lens, a collimating lens, and a pair of spaced-apart gratings arrayed along an optic axis and adapted for providing a magnified moire deflectogram of a phase object. The microscope provides a simple apparatus for preparing a map of optical thickness gradients, from which quantitative data concerning the object can be computed.