The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 1986

Filed:

Apr. 19, 1984
Applicant:
Inventors:

Hiroshi Kanda, Tokorozawa, JP;

Isao Ishikawa, Hino, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73606 ;
Abstract

An acoustic microscope of the type of mechanical scanning in which a single transducer works to generate an acoustic beam as well as to detect echoes reflected from the specimen. An echo reflected from an interface between an acoustic lens and an acoustic propagation medium is detected, and the detected intensity is used as a reference to display the distribution of attenuation factors of the specimen in a two-dimensional manner. Among the signals representing the distribution of attenuation factors of the specimen, furthermore, only those signals having intensities that lie within a predetermined range are displayed to obtain a picture of the specimen that represents the distribution of attenuation factors of a predetermined range only.


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