The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 1986
Filed:
Nov. 01, 1982
Yoshihiro Takahashi, San Jose, CA (US);
Maria A Rey, San Jose, CA (US);
Xertex Corporation, Santa Clara, CA (US);
Abstract
X-ray fluorescence spectrometer for determining the sulfur content of oil and other matrices, and method of calibrating the same. The spectrometer comprises a pulse height analyzer and a computer for analyzing the energy spectrum of photons emitted by a sample in regions corresponding to the energy levels of photons emitted by sulfur and the target line x-rays scattered by the sample. The windows through which the energy is sampled are adjusted to provide a calibration curve of predetermined shape, and a built-in standard is analyzed and a value corresponding to the ratio of the relative intensities of the fluorescent energy from the standard and the scattered target line x-ray radiation is stored during initial calibration of the system. Thereafter, the system is recalibrated simply by analyzing the build-in standard again, adjusting the sampling windows, and adjusting a constant in the relationship by which the sulfur content is determined to compensate for drift in the system.