The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 1986
Filed:
Jul. 06, 1984
Harlan P Mathews, Boulder County, CO (US);
Craig Cambier, Boulder County, CO (US);
Storage Technology Partners II, Louisville, CO (US);
Abstract
A system and method for optically measuring and maintaining track pitch in an optical storage system. A set of at least four calibration tracks, each having a prescribed track pitch or distance therebetween, are precisely placed on a record carrier of the optical storage system during the manufacture thereof. When this record carrier is subsequently inserted into the optical storage system, the track pitch of a select pair of the calibration tracks is optically measured, and an offset signal is generated in response to this measurement. This offset signal is used within the optical storage system for controllably positioning a second radiation beam with respect to a first radiation beam, the first radiation beam being directed to follow a previously written data track on the record carrier. The offset signal may be stored so that it need only be generated during an initialization or calibration mode of the optical storage system, and thereafter be readily available for positioning the second radiation beam relative to the first radiation beam. The select pair of calibration tracks may be an inner pair, having additional tracks adjacent both sides thereof, or an outer pair, having an additional track adjacent only one side thereof; thereby having included in the offset signal the optical effects of having additional data tracks adjacent or not adjacent the respective sides of the pair of calibration tracks whose track pitch is being measured.