The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 1986

Filed:

Sep. 12, 1983
Applicant:
Inventors:

Yoshiro Fukasawa, Tokyo, JP;

Tomoyuki Fukazawa, Tokyo, JP;

Michihiro Kawamura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250347 ; 250343 ; 356323 ;
Abstract

In a double-beam spectrophotometer intended for spectral analysis in the infrared region, inputs to a light detector are switched to dark, reference light, sample light, and reference light in this order, and those components in an output signal of the detector which have a fundamental frequency corresponding to one cycle of the switching and a frequency twice the fundamental frequency undergo arithmetic operation to determine the ratio of the sample to reference light intensity, which is representative of the transmittance of the sample.


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