The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 1986

Filed:

Apr. 20, 1984
Applicant:
Inventors:

Peter W Krempl, Graz, AT;

Wolfgang Schindler, Graz, AT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250343 ; 356437 ;
Abstract

A test volume and a reference volume are irradiated by separate beams of an infrared source, and the two beams are subsequently fed to a detector in periodical alternation. The time constant of the detector is small compared to the period of this alternation. From the measured differences in intensity the masses of the absorbing components of a sample in the test volume are determined. During each period the value of the detector signal is sampled by an evaluation unit at least once while either the test beam or the reference beam is being present at the detector. For separate determination of different sample components, radiation of different defined frequency bands is fed to the detector during each period, and the intensity of the test beam is determined at each of the different frequencies whereas that of the reference beam is determined at one of these frequencies at least.


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