The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 1986

Filed:

Apr. 20, 1984
Applicant:
Inventor:

Douglas R Arnoldi, Southbury, CT (US);

Assignee:

Burroughs Corporation, Detroit, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358285 ; 358293 ; 355 / ;
Abstract

An improvement to a facsimile system which enables the simulation of 240 and 300 DPI feedwise scan resolutions in a system designed to operate at 200 and 400 DPI feedwise scan resolutions. The simulation is accomplished by feedwise advancing a document past a horizontal image scanner in defined sequences of half and full steps, half steps causing the document to be feedwise advanced by one four-hundredth of an inch (as in 400 DPI mode), full steps causing the document to be feedwise advanced by one two-hundredth of an inch (as in 200 DPI mode). The scan resolution errors introduced by the simulation are non-cumulative since the system comes back into feedwise synchronization with true 240 and 300 DPI scan resolutions each time one of the defined three operation sequences is completed. Also, a method of operating a document feeding system to approximate 240 and 300 DPI feedwise scan resolutions.


Find Patent Forward Citations

Arnoldi, Douglas. (1986). Variable resolution scanning in line scan optical imaging systems (U.S. Patent No. 4575769). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4575769

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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