The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 1986

Filed:

Jun. 14, 1983
Applicant:
Inventors:

Kenichi Oinoue, Tokyo, JP;

Kenji Kimura, Tachikawa, JP;

Masatoshi Ida, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250201 ; 354407 ;
Abstract

An apparatus for detecting focus conditions of an imaging optical system is disclosed. The apparatus comprises a light flux dividing means having a plurality of light flux dividing elements arranged at a predetermined focal plane or near a plane conjugated therewith, a photoelectric conversion means having a plurality of light receiving elements arranged to receive light fluxes divided by respective light flux dividing elements in line therewith and means for detecting focus conditions of the imaging optical system based on the outputs of the light receiving elements. The photoelectronic conversion means is so arranged that the cross-section of light fluxes incident upon respective light receiving elements at the exit pupil of the imaging optical system includes regions which are not overlapped with each other.


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