The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 1986

Filed:

Nov. 23, 1984
Applicant:
Inventor:

Thomas S Fleischman, North Canton, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73799 ; 73800 ;
Abstract

Apparatus for monitoring and measuring the growth of a crack in an elastic specimen. The specimen is repeatedly flexed by a piston at a set frequency and periodically slowed to a substantially lower frequency during which time a line scan camera monitors the length of the crack. The camera is positioned such that the specimen is drawn through the scan line thereof. The camera is calibrated such that the output signal from the camera correlates directly to the cracklength. This output signal is digitized, received, and stored by a digital processor for use in determining the crack growth rate.


Find Patent Forward Citations

Fleischman, Thomas. (1986). Apparatus for automated crack growth rate measurement (U.S. Patent No. 4574642). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4574642

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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