The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 1986
Filed:
Aug. 03, 1984
Applicant:
Inventors:
Laszlo Adler, Upper Arlington, OH (US);
Dale W Fitting, Ann Arbor, MI (US);
Michel de Billy, Paris 75015, FR;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73629 ; 73599 ; 73620 ; 73633 ;
Abstract
The properties of the surface layer of a material are measured by a technique which employs the transmission of ultrasonic waves from varying angles of incidence into a specimen, from a transducer at a point spaced from the specimen. The backscattered waves are detected and evaluated from the varying angles to detect the local maximum intensity, from which the corresponding properties of the material are determined.
Adler, Laszlo. (1986). Method for measuring surface and near surface properties of materials (U.S. Patent No. 4574637). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4574637
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile