The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 1986

Filed:

Feb. 29, 1984
Applicant:
Inventors:

Takahisa Masuzawa, Kamakura, JP;

Ichiro Tsuchiya, Tokyo, JP;

Assignee:

University of Tokyo, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05H / ; B23K / ;
U.S. Cl.
CPC ...
2191 / ; 2191 / ; 2191 / ; 2191 / ; 2041 / ; 315-541 ; 31511131 ; 31511181 ;
Abstract

The disclosed ion beam machining device has a plasma-generating chamber, a machining chamber, and an ion-extracting grid disposed between the two chambers, which grid has an insulator layer facing the plasma-generating chamber and a conductor layer facing the machining chamber.


Find Patent Forward Citations

Masuzawa, Takahisa. (1986). Ion beam machining device (U.S. Patent No. 4574179). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4574179

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…