The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 1986
Filed:
Aug. 31, 1984
Applicant:
Inventors:
Itaru Endo, Hachiouji, JP;
Yasuo Inoue, Hachiouji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350526 ; 350528 ; 350509 ; 350515 ;
Abstract
An inverted-design microscope wherein, in order to make an effective micro-operation and microscope observation possible and to make it easy to set and replace system accessories and samples to be observed, holding means capable of holding a plurality of accessory devices together are mounted rotatably respectively a plane vertical to an optical axis and a plane parallel with the optical axis above a stage. The holding means are mounted so as to be movable in parallel with the optical axis by a manual operation.