The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 1986

Filed:

Mar. 27, 1984
Applicant:
Inventors:

Katsuhiko Sugita, Kanazawa, JP;

Makoto Uehara, Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D03D / ;
U.S. Cl.
CPC ...
1393702 ; 139435 ;
Abstract

Production of a weft defect on a cloth under weaving is detected by at least two weft detection units arranged side-by-side on a loom along the path of travel of inserted wefts for issuing a defect signal which is then subjected to automatic allocation of a corresponding penalty. Penalty-loaded defect signals are sequentially accumulated at a control counter so that the loom is stopped when a count at the control has exceeded a given threshold. When a defect is removed by manual mending on the loom during a dwell, a corresponding gain is automatically subtracted from the count at the control counter during sequential accumulation in order to subdue the count below the threshold and to allow restarting of the loom. Automatic inspection on the loom can be carried out on a level with conventional manual inspection of the loom.


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