The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 1986
Filed:
May. 20, 1983
Kenichi Oinoue, Tokyo, JP;
Olympus Optical Company Limited, Tokyo, JP;
Abstract
A method for detecting a focus condition of an objective lens system of a single-lens reflex camera is disclosed. A light flux emanating from the objective lens system is divided into first and second light fluxes by means of a prism array having inclined surfaces whose normal lines make a criticl angle with respect to the optical axis of the imaging optical system. Said first and second light fluxes are transmitted through first and second halves of the objective lens system. The first and second light fluxes are made incident upon first and second light receiving element arrays, respectively, to produce first and second sets of output signals representing light distribution of first and second images formed by the first and second light fluxes. From the first and second sets of output signals, interpolated values are derived to form first and second modified sets of signals composed of the first and second sets of output signals and interpolated values. A correlation between the first and second modified sets of signals is derived to detect the focus condition of the objective lens.