The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 1986
Filed:
Jan. 30, 1984
Shigeo Saimoto, Kingston, CA;
Zbigniew Basinski, Gloucester, CA;
Queen's University at Kingston, Kingston, CA;
Abstract
A method and apparatus for precisely controlling plastic strain rate during plastic deformation testing of a solid material such as a metal or plastic are described in which the effects of elastic strain rates associated with the specimens and machines used for such testing are eliminated by applying corrections proportional to the load on the specimen. Thus strain rate sensitivity, unaffected by the machine or specimen modulus can be measured. Strain rate sensitivity can be used to measure the activation volume of the specimen which may be used for quality control of material processing and/or manufactured articles.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile