The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 1986
Filed:
Jul. 06, 1984
Paul M Romano, Boulder County, CO (US);
James W Baer, Boulder County, CO (US);
James W Hargarten, Boulder County, CO (US);
Storage Technology Partners II, Louisville, CO (US);
Abstract
A beam alignment signal processing system wherein a true beam position error signal is generated regardless of beam intensity. This beam position error signal is used within a beam alignment system that maintains a desired alignment between first and second beams traveling in parallel along a desired optical path. A detector senses the position of the beams as the beams (or portions of the beams) are directed onto a surface thereof. The detector generates a set of position signals that indicate the position at which a beam, or at which an energy centroid associated with a plurality of beams, falls upon the detector surface. A first set of position signals is generated corresponding to the position of the first beam on the detector surface with the second beam turned off. These signals are stored in signal storage means. The second beam is turned back on, and a second set of position signals is generated corresponding to the position of the centroid of the first and second beams on the detector surface. A third set of position signals is then generated from the first and second set of position signals corresponding to the position of the second beam on the detector surface. The position error signal is finally generated from the first and third sets of position signals. Detector offset correction means are employed to remove the effects of detector offset from the sets of position signals. Normalization means are likewise employed to remove the effects of beam intensity variations from the sets of position signals.