The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 1986
Filed:
Sep. 28, 1982
Applicant:
Inventors:
Michel Papuchon, Paris, FR;
Herve Arditty, Paris, FR;
Philippe Graindorge, Paris, FR;
Jean-Pierre Huignard, Paris, FR;
Assignee:
Thomson-CSF, Paris, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ; 356347 ;
Abstract
The invention relates to the interferometric detection of reciprocal and non-reciprocal effects affecting the propagation of optical radiation in a two-armed interferometer. The invention relates to a two-armed interferometer terminating by a photorefractive medium used as an interactive reflector according to the four-wave interferometer principle. The invention particularly applies to the measurement of physical quantities such as displacement, linear velocity, angular velocity, magnetic field, pressure and temperature.