The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 1986
Filed:
Apr. 11, 1984
Applicant:
Inventor:
Tsutomu Okayama, Katsuta, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73720 ; 73726 ; 338-4 ;
Abstract
A differential pressure measuring transducer assembly of semiconductor material including a pressure receiving section producing a displacement when pressure is applied, and a stationary section of large thickness located at an outer periphery of the pressure receiving section. The pressure receiving section is composed of a large thickness portion extending to the stationary section at the outer periphery, and a small thickness portion occupying the rest of the pressure receiving section, and a gauge resistance is provided to the large thickness portion.