The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 1986

Filed:

Feb. 01, 1982
Applicant:
Inventors:

Earl F Herkenhoff, Orinda, CA (US);

Clint W Frasier, Irvine, CA (US);

William J Ostrander, Benicia, CA (US);

Assignee:

Chevron Research Company, San Francisco, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
367 68 ; 367 62 ; 367 74 ;
Abstract

In accordance with the present invention, progressive changes in amplitude as a function of offset of common gathers can be more easily identified by emphasizing the degree of amplitude variation between traces of each gather along a seismic line, and after generating semblance coefficients, displaying the resulting 'weighted' offset traces or representations of such traces as function of either horizontal offset or centerpoint values. A significant --and progressive --change in P-wave reflection coefficient as a function of the angle of incidence (within sections) indicates valuable characteristics, say the fluid hydrocarbon-bearing potential and/or lithology of the reflecting horizon.


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