The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 1986

Filed:

Sep. 06, 1983
Applicant:
Inventors:

Keizo Unno, Tokyo, JP;

Tamotsu Yamamoto, Tokyo, JP;

Hitoshi Shimizu, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23B / ; B23Q / ;
U.S. Cl.
CPC ...
29558 ; 29568 ; 82-14 ; 82 / ; 408150 ; 409233 ;
Abstract

A method and an apparatus for controlling a radial depth of cut of a rotary cutting tool in a machine tool, in particular in a machining center is disclosed wherein an eccentric mechanism for controlling the radial depth of cut of the tip of the cutting tool is not contained in a main shaft as in a conventional machine tool. Instead, it is provided outside the main shaft, and the radial depth of cut of the tip of the cutter is controlled by a tool holder to be automatically changeably fit to the forward end of the main shaft such that a tool holding shaft mounted to the tool holder by means of an eccentric mechanism so as to have the eccentricity relative thereto be adjustable is adapted to be controlled through a depth of cut central shaft passed through the bore of a draw-bar, concentrically disposed within the bore of the main shaft, by means of a servo-motor through a differential gear mechanism and the eccentric mechanism.


Find Patent Forward Citations

Unno, Keizo. (1986). Method and apparatus for controlling the depth of cut in the radial (U.S. Patent No. 4569115). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4569115

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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