The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 1986

Filed:

May. 24, 1983
Applicant:
Inventors:

Heinrich Juergensen, Raisdorf, DE;

Thomas Zelenka, Kiel, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358293 ; 358282 ; 356239 ; 250574 ;
Abstract

A novel apparatus and method for point-to-point and line-by-line opto-electronic scanning of masters mounted on a transparent master carrier and wherein simultaneous opaque and transparency scanning is accomplished to generate opaque and transparency scanning signals for each point of the master with one of the scanning signals being the actual image signal and the other scanning signal being a recognition signal for those points of the master where amplitude errors in the image signal occur due to scattered light and/or shadowing. The disruptive amplitude errors are eliminated by combining the recognition signal with the actual image signal to obtain a substantially error-free signal.


Find Patent Forward Citations

Juergensen, Heinrich. (1986). Method and apparatus for scanning masters (U.S. Patent No. 4568984). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4568984

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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