The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 1986
Filed:
Mar. 08, 1984
Sarkis Barkhoudarian, Canoga Park, CA (US);
Rockwell International Corporation, El Segundo, CA (US);
Abstract
A system for the examination of a test object for internal flaws (or acoustic discontinuities such as solid-to-gas or solid-to-liquid interfaces) by means of ultrasonic waves. The ultrasonic waves 18 are induced in the object 16 by projecting at least one intense, pulsed laser beam 13 on the object 16 and scanning the beam 18 along the object 16. Another laser beam 23 is projected on the object 16, either opposite the first beam 14 or on the same side adjacent to the first beam 14, so that is reacts with and is frequency-modulated by the ultrasonic wave. The reflected, frequency-modulated beam 24 is fed to an optical heterodyning means 26 which passes through only an optical beam 28 modulated with the ultrasonic frequency to a photodetector 30. A flaw 36 (or acoustic discontinuities such as solid-to-gas or solid-to-liquid interfaces) in the test object 16 results either in a decrease or an increase in the output of the photodetector 30, depending on whether the detection laser beam 23 is on the opposite or same side, respectively, of the test object 16 as the ultrasonic-wave-inducing laser beam 13. The system is characterized by non-contact with the test object by the ultrasonic-wave generation-and-detection means.