The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 1986

Filed:

Dec. 18, 1984
Applicant:
Inventors:

Michael P Ekstrom, Redding, CT (US);

David S Chan, Bethel, CT (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
73152 ; 340853 ; 324355 ;
Abstract

A technique is described for producing an image log of an investigation of the wall of a borehole with a high resolution tool. The tool employs sensors for measuring a characteristic such as the conductivity of the wall at locations which circumferentially overlap. An accurate tool depth measuring device is employed to modify the measured characteristic so that the measurement can be displayed as a linear function of depth without visually detectable artifacts. Various signal processing and image enhancing techniques are described to produce an image log on which the characteristic can be seen as a variable intensity image in which small scale variations of the measured characteristic remain discernable and significant features visually stand out from the log.


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