The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 1986
Filed:
Apr. 18, 1983
Jacques Lewiner, 92210 Saint Cloud, FR;
Georges Charpak, Geneve, CH;
Other;
Abstract
In order to read-out and reproduce as a visible image the electric charge distribution carried by a dielectric sheet, and formed by the impact of X-rays having traversed a body to be analyzed, one has recourse to a detecting probe (2) out of center with respect to the axis of a head carrying the probe, the head being put in rotation at a high speed (for instance at 6,000 turns/minute), by a small turbine, the axis of the head being displaced relative to the surface of the sheet, parallel to the sheet along two perpendicular directions X and Y in such a way that the probe scans the sheet along a trajectory (T) which has the form of a circle the center of which is subjected to a transverse translation. The read-out can be made very rapidly and leads to a good signal/noise ratio. This allows the use of low irradiation doses for the object to be analyzed. Means can be used to compensate for variations of distance between the probe and the sheet.