The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 1986
Filed:
Mar. 08, 1984
Fujitsu Limited, Kawasaki, JP;
Abstract
A measuring method and apparatus for measuring a non-linear parameter of an acoustic medium or its distribution, and the application of the parameter to the measurement of internal temperature of a sample noninvasively. A continuous wave ultrasonic probing beam is radiated through the sample, and a pumping wave which is an ultrasonic pulse is superposed on the probing beam. A phase change in the probing beam caused by the pumping wave is detected. From this phase change the non-linear parameter (B/A) is obtained. The invention projects two methods. The first method provides the pumping wave in a direction intersecting the probing beam. The second method projects the pumping wave in a direction along the probing beam in counter direction. From the information concerning the variation of measured value of (B/A), the inner temperature of the sample is obtained. The invention makes it possible to measure the non-linear parameter or temperature which was impossible in the prior art.