The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 1986
Filed:
Oct. 02, 1984
Tadashi Fujii, Fujinomiya, JP;
Yoshinori Hayakawa, Ibaraki, JP;
Terumo Kabushiki Kaisha, Tokyo, JP;
Abstract
A method and apparatus for ultrasonic measurement in which ultrasonic pulses having a plurality of different frequencies are transmitted into in order to object under investigation and derive a mean value of attenuation coefficients indicative of attenuation within the object, as well as the frequency dependence of the attenuation coefficient. If the frequency dependence of the reflection intensity from the object under investigation is constant or proportional to frequency within a range of measured frequencies, it is possible to obtain the attenuation coefficient and the coefficient indicative of its frequency dependence within a small area of the object by measuring the echo intensity of emitted ultrasonic pulses having three different frequencies. Furthermore, extending the above-mentioned processing over all small areas of the entire object enables obtaining a two-dimensional distribution image indicative of the attenuation coefficient and its frequency dependence.