The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 1986

Filed:

Jan. 18, 1985
Applicant:
Inventor:

Joseph M Zacchio, Wethersfield, CT (US);

Assignee:

Transamerica Delaval Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F / ; G01S / ;
U.S. Cl.
CPC ...
7329 / ; 7329 / ; 324 / ; 343 / ; 343753 ;
Abstract

A microwave tank-contents level measuring system is housed within a housing having an open end obturated by a hyperbolically curved convex-plano fluid impermeable solid dielectric lens providing a seal for the tank opening over which the housing is installed while collimating the outgoing ranging signal and focusing the return signal. A separate removable housing cover provides access to the electronic components for service while the tank-opening sealing function of the lens is not disturbed. A transmitting-receiving horn is dimensioned and positioned on the axis of the lens with its effective phase center at the operating frequency coinciding with a focal point of the hyperbolic surface.


Find Patent Forward Citations

Zacchio, Joseph. (1986). Microwave tank-contents level measuring assembly with lens-obturated (U.S. Patent No. 4566321). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4566321

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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