The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 1986

Filed:

Apr. 11, 1983
Applicant:
Inventors:

Michiaki Miyagawa, Hachiooji, JP;

Kouichi Ohki, Tokyo, JP;

Matsuhiko Takaya, Hino, JP;

Naoto Fujihara, Hino, JP;

Tadayuki Yamada, Hino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 48 ; 358 22 ; 358183 ; 382 56 ; 382 61 ;
Abstract

A pattern discriminator receives scanning data obtained by raster scanning objects within predefined window regions with a photoelectric converter, converts the scanned data into pixel binary data by using a threshold value dependent upon the scanning position and window region and evaluates the binary data in accordance with predetermined criteria to produce an output signal indicative of the evaluation. Data specifying the shapes of the desired window regions approximated by polygons is obtained by specifying the apexes of the polygons and a programmed CPU computes the coordinates of each picture element or pixel on the lines connecting adjacent apexes along each window region perimeter. A memory stores the apex and coordinate data which defines the starting and ending points of each window region. Polygonal masks within each window and sub-mask polygonal window regions within each mask can be defined in a similar manner. A shifting detector and position corrector detects the amount of any positional shift of an object being scanned in relation to the position of a previously scanned reference object, and shifts the locations of the defined window regions by the amount of the positioned shift detected.


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Miyagawa, Michiaki. (1986). Pattern discriminator (U.S. Patent No. 4566126). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4566126

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