The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 1986
Filed:
Apr. 19, 1983
Applicant:
Inventors:
Assignee:
Kokusai Denshin Denwa Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371-5 ; 375 86 ; 375 52 ;
Abstract
A bit error rate of M-phase digital phase-modulated waves is measured by the steps comprising multiplying a received wave by M, phase-detecting the M-multiplied signal either directly or after frequency conversion, detecting errors by comparing the output level of the phase detection with a threshold, and counting the number of such errors. By employing above mentioned system, a bit error rate can be measured easily and accurately by a simple circuit structure.
Mizuno, Toshio. (1986). Bit error rate measuring system (U.S. Patent No. 4566100). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4566100
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile