The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 1986

Filed:

Jun. 21, 1982
Applicant:
Inventors:

Gerald A Eisenbrandt, Lincoln Township, Berrien County, MI (US);

James R Marks, Perrysburg, OH (US);

Assignee:

Whirlpool Corporation, Benton Harbor, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; H05B / ;
U.S. Cl.
CPC ...
324 95 ; 219 / ;
Abstract

A method and apparatus for testing microwave ovens to determine if exterior radiation levels exceed permissible maxima. The leakage levels are sensed by a sensor moved along a preselected path accurately spaced from the oven cabinet. The probe is moved automatically at high speed along the path until a leakage level above a preselected value is sensed. A control associated with the apparatus automatically causes the sensor to move subsequently at a reduced speed to determine the maximum leakage at that position. The control causes a repeated traverse of the questioned position at the slow speed to provide an accurate maximum leakage determination. The control includes reference information indicating acceptable levels of leakage along the path of movement of the sensor which are continuously compared with actual sensed values. Different factors are applied to the reference values correlated with the speed of movement of the sensor and the desired coarse or fine scanning accuracy to permit the selective, high speed movement of the sensor between all high leakage positions. Information concerning the location of the high leakage positions is provided at the end of the test to permit facilitated correction of any leakage problems found. The control may further include structure for tagging the device being tested and for other suitable disposition thereof, as desired. The apparatus in the illustrated embodiment includes a robot for automatically moving the sensor along the desired path and an associated control for effecting the desired high speed-low speed movement in providing the rapid determination of high leakage positions.


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