The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 1986

Filed:

Mar. 07, 1983
Applicant:
Inventors:

Robert P Burr, Matinicus, ME (US);

Raymond J Keogh, Huntington, NY (US);

Ronald Morino, Sea Cliff, NY (US);

Jonathan C Crowell, Brooklyn, NY (US);

James B Burr, Centerport, NY (US);

James C Christophersen, West Islip, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 3241 / ;
Abstract

A method and apparatus for testing circuit boards using two or a small number of probes for making resistive and radio frequency impedance measurements e.g. capacitive measurements. The combination of resistive and impedance measurements substantially reduces the number of tests required to verify the integrity of a circuit board. The impedance or capacitive 'norm' values used in testing the circuit boards can be obtained by operating the system in a learning mode. Analysis of the data provides not only fault detection but also can indicate approximate fault location.


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