The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 1986
Filed:
Aug. 31, 1983
Yoshikazu Matsuura, Tokyo, JP;
Teraoka Seiko Co., Ltd., Tokyo, JP;
Abstract
A measuring apparatus includes a plurality of measuring hoppers combined, and measuring means for measuring product to be measured accommodated in the respective measuring hoppers to select a set of a plurality of measured values equal or near to a set weight so as to permit the product of the selected measured values to be exhausted from the hoppers. This invention is intended to improve such a measuring apparatus, particularly a span adjusting mechanism provided at each of a plurality of the measuring hopper by raising or lowering all reference weights at one time. Moreover, the measuring apparatus according to the invention is capable of correcting zero points of the measuring means, while the product to be measured is accommodated in the measuring hoppers and is able to adjust a span which is a ratio of weight to output count of the measuring means in good timing in connection with the hopper selecting operation.